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DFS Blog

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On-site Chemical Blending Increases Overall IC Process Yield, When Done Right.

Posted by Karl Urquhart on Jul 11, 2018 12:06:00 PM

Precise control of chemical composition through use of on-site chemical blending and mixing systems improves overall IC process yield. 

This is accomplished by providing more consistent quality of materials that come into contact with the wafer and its forming circuits. 

On-site blending results in tighter assay control, higher purity, and lower particles. On-site blenders also allow users to test materials suppliers for comparison to optimize ROI and control cost. 

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Topics: chemical blending, IC manufacturing